Infrared microscope "IR-1300RL"
An infrared reflection microscope system for measuring the dimensions of various interface parts of silicon devices with clear images.
The "IR1300RL" is an infrared microscope that uses the Olympus BX53 microscope body. With a high-resolution infrared CMOS camera and image enhancement software, it can measure the dimensions of various parts of the interfaces of silicon devices with clear images. Additionally, the unique image enhancement software allows for the measurement of alignment mark misalignment on bonded wafers. 【Features】 ■ Measures the dimensions of various parts of the interfaces of silicon devices with clear images ■ Uses the Olympus BX53 microscope body ■ Manual operation type for X, Y, and Z axes ■ Capable of measuring alignment mark misalignment *For more details, please refer to the PDF document or feel free to contact us.
- Company：ディスク・テック 本社
- Price：Other
